• 0379672326
  • alhelmy@um.edu.my

Publications

  • Mahmoud, MM, Soin, N (2019). A comparative study of lifetime reliability of planar MOSFET and FinFET due to BTI for the 16 nm CMOS technology node based on reaction-diffusion model. Microelectronic Reliability. Vol: 97,53-65. (ISI-Indexed)
  • Rahman, Sharidya., Hatta, S. W. M., & Soin, N. (2019). Analytical Optimization of AlGaN/GaN/AlGaN DH-HEMT Device Performance Based on Buffer Characteristics. ECS Journal of Solid State Science and Technology, volume 8, issue 2, P165-P173 (ISI-Indexed)
  • Abdul Wahab, Y., Fadzil, A., Soin, N., Fatmadiana, S., Zaman Chowdhury, Z., Hamizi, N. A., . . . Al-Douri, Y. (2019). Uniformity improvement by integrated electrochemical-plating process for CMOS logic technologies. Journal of Manufacturing Processes, 38, 422-431. doi:https://doi.org/10.1016/j.jmapro.2019.01.025 (ISI-Indexed)
  • Othman, N. A. F., Azhari, F. N. N., Hatta, S. W. M., & Soin, N. (2018). Optimization of 7 nm Strained Germanium FinFET Design Parameters Using Taguchi Method and Pareto Analysis of Variance. ECS Journal of Solid State Science and Technology, 7(4), P161-P169. (ISI-Indexed)
  • Nur Samihah Khairir, Rozina Abdul Rani, Rosmalini Ab Kadir, Norhayati Soin, Wan Fazlida Hanim Abdullah, Mohamad Hafiz Mamat, M. Rusop, Ahmad Sabirin Zoolfakar.(2018) Electrical Behavior of a Nanoporous Nb2O5/Pt Schottky Contact at Elevated Temperatures, Journal of Electronic Materials. pp1-10 (ISI-Indexed)
  • Mazita Mohamad,Norhayati Soin,Fatimah Ibrahim (2018).Design optimisation of high sensitivity MEMS piezoresistive intracranial pressure sensor using Taguchi approach. Microsystem Technologies. Vol 23.pp1-16. (ISI-Indexed)